T86.10 Optical and optical-physical measurements

State system of ensuring the unity of measurements. Measurement techniques of index of refraction distribution in transparent phase objects

State system for ensuring the uniformity of measurements. State verification schedule for means of measuring of the angle of rotation of the plane of polarization

State system for ensuring the uniformity of measurements. Measurements of coefficients of regular and diffuse transmittance of ultraviolet radiation. Methods for measurements

State system for ensuring the uniformity of measurements. Reflectometers of the extreme ultraviolet radiation for measurements of the characteristics of multilayer nanostructures in the wavelength range 10 to 30 nm. Measurement procedure

State system for ensuring the uniformity of measurements. Photovoltaic devices. Part 3. Measurement principles of photovoltaic devices characteristics with terrestrial reference spectral irradiance data