Teodolites. Methods for determination of errors of horizontal circle diameter
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Vernier callipers. Specifications
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State system for ensuring the uniformity of measurements. Reference conditions for linear and angular measurements
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State system for ensuring the uniformity measurements. Permissible errors of measurement of linear dimensions to 500 mm
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State system for ensuring the uniformity of measurements. Convex spherical mirrors. Measurement technique of curvature radius and local departures of surfaces forms from sphericity by holographic shear interferometry
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The state system of ensuring the uniformity of measurements. Permissible errors of measurement of linear dimensions to 500 mm with non-specified tolerances
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State system for ensuring the uniformity of measurements. Interplanar spacings in crystals and the intensity distribution in diffraction patterns. Method for measurement by means of an electron diffractometer
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State system for ensuring the uniformity of measurements. Interpenar spacings in crystals. Method for measurement by means of a transmission electron microscope
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State system for ensuring the uniformity of measurements. Dimensional parameters of nanoparticles and thin films. Method for measurement by means of a small angle X-ray scattering diffractometer
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State system for ensuring the uniformity of measurements. Method of surface roughness effective height measurements by means of scanning probe atomic force microscope
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State system for ensuring the uniformity of measurements. Dispersion content of gas atmospheres. Determination of nanoparticle size by diffusion spectral analysis
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On the verification of radius templates
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