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OST

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Quantrons. Basic parameters.

Chamber of humidity and formation of fungi. Methods and tools for evaluation.

Integrated microcircuits. Low, intermediate and high frequency amplifiers. Method of measuring upper and lower cut-off frequencies.

Polymeric Materials. Methods for determining of corrosively in relation to metals.

electromechanical and piezoelectric filters. Measurement methods of frequency characteristics of phase shifts.

Character indicators. Methods of measurement and determination of parameters, characterizing the quality of displayed information and reliability of its perception.

Measuring installations of electrical parameters of electronic microwave devices. Methods and means of verification.

Tantalum polar cylindrical sealed volume-porous capacitors. Nominal voltage, capacity, dimensions, and combinations thereof.

Equipment for manufacturing electronic devices. Technological running -in period. General requirements.

Equipment for manufacturing electronic devices. General requirements for exporting.

М-type amplifying devices. Electric parameters measuring methods.

Household electronic devices. Transportation and packaging requirements. Testing methods.

Special materials for electronic equipment. Labelling, packaging, shipping and storage. Package testing methods.

bipolar transistors. The system parameters.

Air conditioning pneumatic units with rated pressure 0,63 MPa (6,3 kg*f/cm2). Design, parameters and dimensions.

Air filter for nominal pressure of 0.63 MPa (6.3 kgf / sq.cm.). Design, parameters and dimensions.

Air-oil lubricator for nominal pressure of 0.63 MPa ( 6.3 kgf / cm2). Design, parameters and dimensions.

Pressure control devices for 0,63 MPa nominal pressure (6,3 kgf/cm2). Design, parameters and dimensions.

Pneumatic throttle valves with rated pressure 0,63 MPa (6,3 kg*f/cm2). Design, parameters and dimensions.

Dissectors. Guidance on the application.

Microprocessor-bases means of computer equipment. Fixed hard disk drive. Basic parameters.

Wrist and pocket electronic watch. Parameter measurement methods.

Integrated microcircuits. Method of measuring continuous voltage stabilizers readiness.

Photomultipliers.Application guideline.

Vidicons. Application guideline.

Image multiplier orthicons and image isogons. Application guide.

Polymeric materials for protecting and encapsulating semiconductor devices and integrated circuits. Methods for determination of volume resistivity dependence on temperature and thermally stimulated depolarization current.

Polymeric materials for protecting and encapsulating semiconductor devices and integrated circuits. Methods for determination of adhesion.

Glassceramic cement. Grades.

Integrated microcircuits. Series КР 132 ( KR132RU6 ). Application guide.

Vacuum character indicators. Main dimensions.

Microwave modules. Appearance and control requirements and control methods.

Piezoceramic materials. Specifications.

Inorganic dielectrics. Method for determination of the dielectric conductivity and dielectric dissipation factor at frequency 1 MHz.

Integrated microcircuits. Methods for measuring AC voltage gain of operational amplifiers.

Vacuum integral circuits. General technical specifications.

cathode-heating Nodes for Cathode ray devices for colour picture tube. General specifications.

SHF vacuum tubes. Output waveguide device with flat windows. Design, dimensions, parameters.

Vacuum tubes and SHF protection devices. Reference designation system.

OST 11-0467.0-87

Integrated microcircuits. Filters. General requirements for measurement of electrical parameters.

OST 11-0467.1-87

Integrated microcircuits. Filters. Method of measuring level of discharge of analog memory.

OST 11-0467.2-87

Integrated microcircuits. Filters. Method for measuring voltage gain coefficient, variation coefficient of frequency characteristic, attenuation in attenuation band.

OST 11-0467.3-87

Integrated microcircuits. Filters. Method of measurement input noise voltage, output psophometric noise.

OST 11-0467.4-87

Integrated microcircuits. Filters. Method of measuring the upper (lower) cut-off frequency band-pass range, the maximum (minimum) clock signal pulse frequency.

Fluxes and solders for soldering. Types. Technical requirements .

Oscillator, modulator and regulation tubes with anode dissipated power above 25 watts. System parameters.

Voltage-controlled resistors. System of parameters.

Monolithic ceramic capacitors for general use. Nominal voltage, capacity, dimensions and their combinations.

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