Other norms

FR.1.34.2011.11537
FR.1.34.2011.11537
Methods of measuring electrical energy and power of JSC "Fortum" branch of Tyumen CHPP-1 "
FR.1.35.2011.09619
FR.1.35.2011.09619
Automated monitoring system of a typical unified monitoring server. GSE. Measurement of the suspension height of the antennas by geodetic and navigation measuring instruments. Measurement Technique at Radio Monitoring
FR.1.35.2011.09620
FR.1.35.2011.09620
Internal resistance of power supplies of technical security equipment. Measurement Technique
FR.1.35.2011.09621
FR.1.35.2011.09621
Output impedance of information channels of cellular interlocks. Measurement Technique
FR.1.35.2011.09622
FR.1.35.2011.09622
Linear and angular characteristics of detection zones of radio-beam security detectors. Measurement Technique
FR.1.35.2011.09623
FR.1.35.2011.09623
Radiation power in the working frequency bands of cellular interlocks. Measurement Technique
FR.1.35.2011.09624
FR.1.35.2011.09624
The operating frequency range of the radiation blockers cellular. Measurement Technique
FR.1.35.2011.11072
FR.1.35.2011.11072
Method of measuring short-circuit current of standard solar cells based on nanostructured AIIIBV compounds (GaAs) using the MK-USCH metrology unit “MK-SE”
FR.1.35.2011.11073
FR.1.35.2011.11073
Method for measuring the absolute spectral sensitivity of standard solar cells based on nanostructured AIIIBV compounds (GaAs) using the installation for measuring the spectral sensitivity MK-USC
FR.1.35.2011.11074
FR.1.35.2011.11074
Short-Circuit Current Measurement Technique for Polymer-fullerene Standard Solar Cells with Extended Spectral Sensitivity Range and Standard Solar Cells Based on Thin Film Technology
FR.1.35.2011.11075
FR.1.35.2011.11075
Measurement method of the absolute spectral sensitivity of polymer-fullerene standard solar cells with an expanded range of spectral sensitivity and standard solar cells based on thin film technology
FR.1.35.2011.11218
FR.1.35.2011.11218
Measurement Technique. Equivalent series resistance of capacitors in the frequency range from 0.3 MHz to 1.5 GHz
FR.1.35.2011.11232
FR.1.35.2011.11232
KDShYu.460314.012 MVI "Methods of measuring the intensity of the electromagnetic field generated by the base stations of the LTE standard"
FR.1.35.2011.11233
FR.1.35.2011.11233
KDSHYu.460314.013 MVI "Methods of measuring the bandwidth of the base station channel LTE standard"
FR.1.35.2011.11234
FR.1.35.2011.11234
KDSHYu.460314.014 MVI "Methods of measuring the center frequency channel of LTE standard base stations"
FR.1.36.2011.10216
FR.1.36.2011.10216
Methods of measuring the decrement of vibrations in metals and alloys of structural purpose
FR.1.37.2011.09963
FR.1.37.2011.09963
GSE. Illuminance, energy illumination, brightness, energy brightness in the wavelength range 0.4-1.1 microns. Measurement Method (Method)
FR.1.37.2011.10423
FR.1.37.2011.10423
GSE. The method of measuring the surface roughness by the method of interference optical microscopy (optical profilometry)
FR.1.37.2011.10793
FR.1.37.2011.10793
MVI 3-253/2011 Methods for measuring the parameters of surface plasmon resonance of metal nanoparticles in solution
FR.1.37.2011.10834
FR.1.37.2011.10834
Absolute spectral sensitivity of photoresists in the wavelength range of 0, 8-400 nm. Measurement Method (Method)
FR.1.37.2011.10835
FR.1.37.2011.10835
Radiation flux and energy illumination in the wavelength range of 0.8-400 nm. Measurement Method (Method)
FR.1.37.2011.10836
FR.1.37.2011.10836
Energy exposure and energy illumination in the wavelength range 0.8-400 nm. Photodetectors with multilayer nanostructures. Measurement Method (Method)
FR.1.37.2011.10837
FR.1.37.2011.10837
Zone sensitivity and temporal stability of photodiodes with multilayer nanostructures in the wavelength range of 10-30 nm. Measurement Method (Method)
FR.1.37.2011.10838
FR.1.37.2011.10838
Energy brightness with high spatial resolution in the wavelength range of 0.8-400 nm. Measurement Method (Method)
FR.1.37.2011.10839
FR.1.37.2011.10839
Spectral coefficients of specular and diffuse reflection in the wavelength range of 0.8-400 nm. Measurement Method (Method)
FR.1.37.2011.10840
FR.1.37.2011.10840
Effective characteristics of thin-film nanostructured coatings in the infrared region of the spectrum. Measurement Method (Method)
FR.1.37.2011.10867
FR.1.37.2011.10867
Measurement technique for assessing the acoustic properties of noise-absorbing polymer composite materials MI 1.2.39-2011
FR.1.37.2011.10868
FR.1.37.2011.10868
Measurement methods for the complex dielectric constant of radio-absorbing polymer composites based on PNA series vector network analyzers in the frequency range from 0.1 to 40 GHz MI 1.2.40-2011
FR.1.37.2011.10869
FR.1.37.2011.10869
Methods for measuring the width, angles of divergence and quality parameters of a laser beam
FR.1.37.2011.10999
FR.1.37.2011.10999
MI-113-2011 Method of measuring the power of UV radiation using a detector for nanolithography
FR.1.37.2011.11067
FR.1.37.2011.11067
Measurement technique for spectral attenuation in nanostructured photonic crystal fibers
FR.1.37.2011.11068
FR.1.37.2011.11068
Measurement technique for polarization mode dispersion in nanostructured photonic crystal fibers
FR.1.37.2011.11069
FR.1.37.2011.11069
Method for measuring chromatic dispersion in nanostructured photonic crystal fibers
FR.1.37.2011.11086
FR.1.37.2011.11086
MVI 5-253/2011. Method of measuring particle size by static light scattering
FR.1.37.2011.11090
FR.1.37.2011.11090
Method for measuring chromaticity coordinates of lamps based on semiconductor multilayer nanoscale heterostructures (LEDs)
FR.1.37.2011.11091
FR.1.37.2011.11091
Methods of measuring the spatial distribution of luminous intensity of lamps based on nanoscale heterostructures (LEDs)
FR.1.37.2011.11092
FR.1.37.2011.11092
Methods of measuring the luminous flux of lamps based on semiconductor multilayer nanoscale heterostructures (LEDs)
FR.1.37.2011.11093
FR.1.37.2011.11093
Methods of measuring the light output of lamps based on nanoscale heterostructures (LEDs)
FR.1.37.2011.11442
FR.1.37.2011.11442
GSE. The brightness in the wavelength range of 0.38-0.80 microns. Measurement Method (Method)
FR.1.38.2011.09330
FR.1.38.2011.09330
MVI specific activity of uranium-238, thorium-232 in products of baddeleyite production with disturbed radioactive equilibrium of decay products of radium-226
FR.1.38.2011.10001
FR.1.38.2011.10001
GSE. Measurement of parameters of radiation of radio-electronic means by digital measuring receivers "ARGAMAK-I", "ARGAMAK-IM" and ARGAMAK-IS "
FR.1.38.2011.10015
FR.1.38.2011.10015
Measurement of the specific activity of radium 226Ra in mineral and drinking water by the emanation method using the radiometer of radon activity AlphaGUARD PQ 2000
FR.1.38.2011.10022
FR.1.38.2011.10022
MVI specific activity of radon-222 and radium-226 in water
FR.1.38.2011.10023
FR.1.38.2011.10023
Measurement Technique for Measuring Radon-222 Volumetric Activity in Soil Air
FR.1.38.2011.10024
FR.1.38.2011.10024
Measurement technique of equivalent equilibrium volumetric activity of radon-222 and radon-220 (toron) and its component, due to the unattached fraction of the daughter decay products, in the air of various premises
FR.1.38.2011.10025
FR.1.38.2011.10025
Methods for measuring the volumetric activity of radon-222, its daughter decay products (polonium-218, lead-214, bismuth-214) and equivalent equilibrium volumetric activity of radon-222, radon-220 in indoor air of various purposes
FR.1.38.2011.10026
FR.1.38.2011.10026
Methods for performing radon-222 flux density measurements from various surfaces
FR.1.38.2011.10033
FR.1.38.2011.10033
Method for measuring the specific activity of natural radionuclides, cesium-137, strontium-90 in samples of environmental objects and products of enterprises

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