Other norms

2011

ATK-RE 2011
ATK-RE 2011
Shell and tube heat exchangers and "pipe in pipe" heat exchangers. Manual
FERm-2001-11
FERm-2001-11
Devices of automation and computer technology
Price: $154.23
FR.1.27.2011.09117
FR.1.27.2011.09117
MWI 08-2009 "Methods for measuring the average hydrodynamic radius of phosphors on the spectrometer for dynamic light scattering" Photocor-complex
FR.1.27.2011.09120
FR.1.27.2011.09120
MVI 14-2009 "Methods for measuring the geometric parameters of arrays of oxide nanoscale structures by atomic force microscopy"
FR.1.27.2011.09121
FR.1.27.2011.09121
Timber round. Method of determining the volume of the party using the truncated cone method when performing accounting operations
FR.1.27.2011.09288
FR.1.27.2011.09288
Recommendation "GSI. Orientation of large crystals on an X-ray diffractometer. Methods for performing X-ray diffraction measurements"
FR.1.27.2011.09289
FR.1.27.2011.09289
Recommendation "GSI. Linear and bulk defects in crystal structures. Measurement technique using a two-crystal x-ray topographic spectrometer
FR.1.27.2011.09290
FR.1.27.2011.09290
Recommendation "GSI. Integral structural parameters of nanoparticles and clusters in mono-dispersed systems, thickness and repeatability period in thin films"
FR.1.27.2011.09291
FR.1.27.2011.09291
Recommendation "GSI. Orientation of the sample, unit cell parameters and symmetry of single crystals in the temperature range 10-800K. Measurement technique using Enraf-Nonius and Huber four-circle X-ray diffractometers"
FR.1.27.2011.09292
FR.1.27.2011.09292
Recommendation "GSI. Polycrystal Phase Analysis. Measurement Technique Using the CARD-6 X-Ray Diffractometer."
FR.1.27.2011.09293
FR.1.27.2011.09293
Recommendation "GSI. High-resolution spatial-angular reflectometric measurements. Measurement technique using high-resolution scanning reflectometer"
FR.1.27.2011.09294
FR.1.27.2011.09294
Recommendation "GSI. Parameters of the structure of single crystals and complex multilayer nanocompositions. Methods for performing measurements by the X-ray diffraction method."
FR.1.27.2011.09295
FR.1.27.2011.09295
Recommendation "GSI. Homogeneity of crystalline objects. Methods for performing measurements using the method of two-crystal X-ray diffractometry"
FR.1.27.2011.09296
FR.1.27.2011.09296
Recommendation "GSI. Broken layers and applied coatings. X-ray measurement technique"
FR.1.27.2011.09297
FR.1.27.2011.09297
Recommendation "GSI. The Spatial Distribution of Atoms in Crystals. Methods for Performing Measurements with an AHRN X-ray Spectrometer"
FR.1.27.2011.09298
FR.1.27.2011.09298
Recommendation "GSI. Linear dimensions of objects in the range of 2-100 microns. Measurement technique on a Carl Zeiss E2 optical microscope"
FR.1.27.2011.09299
FR.1.27.2011.09299
Recommendation "GSI. Spectral indices of attenuation of condensed media in the wavelength range 0.2-50 μm. Measurement technique by spectrophotometric method"
FR.1.27.2011.09302
FR.1.27.2011.09302
Recommendation "GSI. Interplanar distances in crystals. Measurement technique using an EM-430ST transmission electron microscope"
FR.1.27.2011.09303
FR.1.27.2011.09303
GSE. The linear dimensions of the elements of topography of the surface microrelief of solid materials. Measurement Technique Using JSM-840 and BS-340 Scanning Electron Microscopes
FR.1.27.2011.09304
FR.1.27.2011.09304
Recommendation "GSI. Structure of the crystal surface in the case of diffraction of electrons by reflection. Methods for performing measurements by the electron-diffraction method"
FR.1.27.2011.09305
FR.1.27.2011.09305
Recommendation "GSI. Interplanar distances in crystals in the range of 0, 1 ÷ 60 nm. Distribution of reflex intensities in diffraction patterns. Methods for performing measurements using an EMR-102 electronograph
FR.1.27.2011.09306
FR.1.27.2011.09306
GSE. Electromechanical coupling coefficient and temperature coefficient of the frequency of piezoelectric crystals Measurement technique on the Piezo-1 installation
FR.1.27.2011.09307
FR.1.27.2011.09307
Recommendation "GSI. Orientation of Single Crystals and Sapphire Plates. Measurement Technique on a DRON X-ray Diffractometer"
FR.1.27.2011.09308
FR.1.27.2011.09308
Recommendation "GSI. Interplanar distances in crystals in the range of 0.08 to 60 nm; intensity distribution in diffraction patterns. Methods for performing measurements using an EMR-102 electron diffractometer (modernized)"
FR.1.27.2011.09309
FR.1.27.2011.09309
Recommendation "GSI. Determination of the density of the surface layers of multilayer heterostructures. Measurement technique using the HRR-100 X-ray high resolution scanning reflectometer (modernized)"
FR.1.27.2011.09310
FR.1.27.2011.09310
Recommendation "GSI. Metric Surface Parameters. Measurement Technique Using a Ntegra Prima Scanning Probe Nanaboratory"
FR.1.27.2011.09311
FR.1.27.2011.09311
Recommendation "GSI. Sizes of nanoparticles in polydisperse systems and the shape of biomacromolecules in solutions. Measurement technique using a small-angle Hecus X-ray diffractometer" SAXS System 3 "
FR.1.27.2011.09312
FR.1.27.2011.09312
Recommendation "GSI. Interplanar distances in crystals in the range of 0, 1 ÷ 30 nm; intensity distribution in diffraction pictures. Methods for performing measurements using an electron diffractometer EMR-110K"
FR.1.27.2011.09313
FR.1.27.2011.09313
Recommendation "GSI. Linear dimensions of the elements of the topology of the microrelief of the surface of solid materials. Methods of measurement using a scanning electron microscope JSM-7401F"
FR.1.27.2011.09314
FR.1.27.2011.09314
Recommendation "GSI. Particle Sizes and Particle Size Distribution. Measurement Technique Using a JSM-6460LV Scanning Electron Microscope"
FR.1.27.2011.09315
FR.1.27.2011.09315
Recommendation "GSI. Determination of polytypes of silicon carbide single crystals. Measurement technique using X-ray diffractometer Xcalibur S with a coordinate detector
FR.1.27.2011.09316
FR.1.27.2011.09316
Recommendation "GSI. Metric Parameters of Polymer Microcapsules in Aqueous Suspensions. Measurement Technique Using a Leica TCS SPE Optical Microscope"
FR.1.27.2011.09317
FR.1.27.2011.09317
Recommendation "GSI. Linear dimensions of the elements of the topology of the microrelief of the surface of solid materials recorded in ionic and electron beams. Methods of measurement using a Quanta 200 3D microscope
FR.1.27.2011.09318
FR.1.27.2011.09318
Recommendation "Metric Surface Parameters. Measurement Technique Using the Ntegra Aura Scanning Probe Nanaboratory"
FR.1.27.2011.09319
FR.1.27.2011.09319
Recommendation "GSI. Metric Surface Parameters. Measurement Technique Using a Solver P47H Scanning Probe Microscope"
FR.1.27.2011.09320
FR.1.27.2011.09320
Recommendation "Measurement of linear dimensions of objects in image mode and interplanar distances in diffraction mode. Measurement technique using a JEM-2100 transmission electron microscope"
FR.1.27.2011.09321
FR.1.27.2011.09321
Recommendation "Linear dimensions of micro and nano-objects. Measurement technique using S-4800 scanning electron microscope"
FR.1.27.2011.09322
FR.1.27.2011.09322
Recommendation "GSI. Interplanar distances in crystals and intensity distribution in diffraction patterns. Measurement technique using an electronic diffractometer"
FR.1.27.2011.09323
FR.1.27.2011.09323
Recommendation "Interplanar distances in crystals. Measurement technique using a transmission electron microscope"
FR.1.27.2011.09324
FR.1.27.2011.09324
Recommendation "Dimensional Parameters of Nanoparticles and Thin Films. Measurement Technique Using a Small Angle X-ray Diffractometer"
FR.1.27.2011.09325
FR.1.27.2011.09325
GSE. Methods of measuring the effective height of surface roughness using a scanning probe atomic force microscope
FR.1.27.2011.09980
FR.1.27.2011.09980
Microspherical and ground cracking catalysts. Methods of measuring the pore volume by saturation
FR.1.27.2011.10156
FR.1.27.2011.10156
Measurement Technique. Measurement of geometrical parameters when setting up devices 19 M, GKU TsP-3, simulator of the control base element (during the construction of orders 01201, 01202 and subsequent this series)
FR.1.27.2011.10214
FR.1.27.2011.10214
Methods of measuring the parameters of structural objects in metallographic studies of welded joints and surfacing of low-activated radiation-resistant steels in equipment and pipelines of nuclear power plants
FR.1.27.2011.10215
FR.1.27.2011.10215
Method of measuring the volume fraction of dispersed precipitates in high-temperature steels and alloys using scanning electron microscopy
FR.1.27.2011.10218
FR.1.27.2011.10218
Method for Determining the Size of Nanostructured Powders by Laser Diffraction
FR.1.27.2011.10219
FR.1.27.2011.10219
Method for determining the fractal dimension of structural elements using electronic and optical metallography
FR.1.27.2011.10222
FR.1.27.2011.10222
Method for determining the size and bulk density of α-FeSi dispersed precipitates in the Fe-Cu-Nb-Si-B nanocrystalline alloy

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