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Shell and tube heat exchangers and "pipe in pipe" heat exchangers. Manual

Devices of automation and computer technology

Price: $179.19

FR 1.31.2011.11267

Methods for measuring the mass concentration of hydrogen sulfide in industrial emissions into the atmosphere by the photocolorimetric method

FR 1.31.2011.11275

Methods for measuring the mass concentration of mercaptans (by methyl mercaptan) in industrial emissions into the atmosphere by the photocolorimetric method

FR.1.27.2011.09117

MWI 08-2009 "Methods for measuring the average hydrodynamic radius of phosphors on the spectrometer for dynamic light scattering" Photocor-complex

FR.1.27.2011.09120

MVI 14-2009 "Methods for measuring the geometric parameters of arrays of oxide nanoscale structures by atomic force microscopy"

FR.1.27.2011.09121

Timber round. Method of determining the volume of the party using the truncated cone method when performing accounting operations

FR.1.27.2011.09288

Recommendation "GSI. Orientation of large crystals on an X-ray diffractometer. Methods for performing X-ray diffraction measurements"

FR.1.27.2011.09289

Recommendation "GSI. Linear and bulk defects in crystal structures. Measurement technique using a two-crystal x-ray topographic spectrometer

FR.1.27.2011.09290

Recommendation "GSI. Integral structural parameters of nanoparticles and clusters in mono-dispersed systems, thickness and repeatability period in thin films"

FR.1.27.2011.09291

Recommendation "GSI. Orientation of the sample, unit cell parameters and symmetry of single crystals in the temperature range 10-800K. Measurement technique using Enraf-Nonius and Huber four-circle X-ray diffractometers"

FR.1.27.2011.09292

Recommendation "GSI. Polycrystal Phase Analysis. Measurement Technique Using the CARD-6 X-Ray Diffractometer."

FR.1.27.2011.09293

Recommendation "GSI. High-resolution spatial-angular reflectometric measurements. Measurement technique using high-resolution scanning reflectometer"

FR.1.27.2011.09294

Recommendation "GSI. Parameters of the structure of single crystals and complex multilayer nanocompositions. Methods for performing measurements by the X-ray diffraction method."

FR.1.27.2011.09295

Recommendation "GSI. Homogeneity of crystalline objects. Methods for performing measurements using the method of two-crystal X-ray diffractometry"

FR.1.27.2011.09296

Recommendation "GSI. Broken layers and applied coatings. X-ray measurement technique"

FR.1.27.2011.09297

Recommendation "GSI. The Spatial Distribution of Atoms in Crystals. Methods for Performing Measurements with an AHRN X-ray Spectrometer"

FR.1.27.2011.09298

Recommendation "GSI. Linear dimensions of objects in the range of 2-100 microns. Measurement technique on a Carl Zeiss E2 optical microscope"

FR.1.27.2011.09299

Recommendation "GSI. Spectral indices of attenuation of condensed media in the wavelength range 0.2-50 μm. Measurement technique by spectrophotometric method"

FR.1.27.2011.09302

Recommendation "GSI. Interplanar distances in crystals. Measurement technique using an EM-430ST transmission electron microscope"

FR.1.27.2011.09303

GSE. The linear dimensions of the elements of topography of the surface microrelief of solid materials. Measurement Technique Using JSM-840 and BS-340 Scanning Electron Microscopes

FR.1.27.2011.09304

Recommendation "GSI. Structure of the crystal surface in the case of diffraction of electrons by reflection. Methods for performing measurements by the electron-diffraction method"

FR.1.27.2011.09305

Recommendation "GSI. Interplanar distances in crystals in the range of 0, 1 ÷ 60 nm. Distribution of reflex intensities in diffraction patterns. Methods for performing measurements using an EMR-102 electronograph

FR.1.27.2011.09306

GSE. Electromechanical coupling coefficient and temperature coefficient of the frequency of piezoelectric crystals Measurement technique on the Piezo-1 installation

FR.1.27.2011.09307

Recommendation "GSI. Orientation of Single Crystals and Sapphire Plates. Measurement Technique on a DRON X-ray Diffractometer"

FR.1.27.2011.09308

Recommendation "GSI. Interplanar distances in crystals in the range of 0.08 to 60 nm; intensity distribution in diffraction patterns. Methods for performing measurements using an EMR-102 electron diffractometer (modernized)"

FR.1.27.2011.09309

Recommendation "GSI. Determination of the density of the surface layers of multilayer heterostructures. Measurement technique using the HRR-100 X-ray high resolution scanning reflectometer (modernized)"

FR.1.27.2011.09310

Recommendation "GSI. Metric Surface Parameters. Measurement Technique Using a Ntegra Prima Scanning Probe Nanaboratory"

FR.1.27.2011.09311

Recommendation "GSI. Sizes of nanoparticles in polydisperse systems and the shape of biomacromolecules in solutions. Measurement technique using a small-angle Hecus X-ray diffractometer" SAXS System 3 "

FR.1.27.2011.09312

Recommendation "GSI. Interplanar distances in crystals in the range of 0, 1 ÷ 30 nm; intensity distribution in diffraction pictures. Methods for performing measurements using an electron diffractometer EMR-110K"

FR.1.27.2011.09313

Recommendation "GSI. Linear dimensions of the elements of the topology of the microrelief of the surface of solid materials. Methods of measurement using a scanning electron microscope JSM-7401F"

FR.1.27.2011.09314

Recommendation "GSI. Particle Sizes and Particle Size Distribution. Measurement Technique Using a JSM-6460LV Scanning Electron Microscope"

FR.1.27.2011.09315

Recommendation "GSI. Determination of polytypes of silicon carbide single crystals. Measurement technique using X-ray diffractometer Xcalibur S with a coordinate detector

FR.1.27.2011.09316

Recommendation "GSI. Metric Parameters of Polymer Microcapsules in Aqueous Suspensions. Measurement Technique Using a Leica TCS SPE Optical Microscope"

FR.1.27.2011.09317

Recommendation "GSI. Linear dimensions of the elements of the topology of the microrelief of the surface of solid materials recorded in ionic and electron beams. Methods of measurement using a Quanta 200 3D microscope

FR.1.27.2011.09318

Recommendation "Metric Surface Parameters. Measurement Technique Using the Ntegra Aura Scanning Probe Nanaboratory"

FR.1.27.2011.09319

Recommendation "GSI. Metric Surface Parameters. Measurement Technique Using a Solver P47H Scanning Probe Microscope"

FR.1.27.2011.09320

Recommendation "Measurement of linear dimensions of objects in image mode and interplanar distances in diffraction mode. Measurement technique using a JEM-2100 transmission electron microscope"

FR.1.27.2011.09321

Recommendation "Linear dimensions of micro and nano-objects. Measurement technique using S-4800 scanning electron microscope"

FR.1.27.2011.09322

Recommendation "GSI. Interplanar distances in crystals and intensity distribution in diffraction patterns. Measurement technique using an electronic diffractometer"

FR.1.27.2011.09323

Recommendation "Interplanar distances in crystals. Measurement technique using a transmission electron microscope"

FR.1.27.2011.09324

Recommendation "Dimensional Parameters of Nanoparticles and Thin Films. Measurement Technique Using a Small Angle X-ray Diffractometer"

FR.1.27.2011.09325

GSE. Methods of measuring the effective height of surface roughness using a scanning probe atomic force microscope

FR.1.27.2011.09980

Microspherical and ground cracking catalysts. Methods of measuring the pore volume by saturation

FR.1.27.2011.10156

Measurement Technique. Measurement of geometrical parameters when setting up devices 19 M, GKU TsP-3, simulator of the control base element (during the construction of orders 01201, 01202 and subsequent this series)

FR.1.27.2011.10214

Methods of measuring the parameters of structural objects in metallographic studies of welded joints and surfacing of low-activated radiation-resistant steels in equipment and pipelines of nuclear power plants

FR.1.27.2011.10215

Method of measuring the volume fraction of dispersed precipitates in high-temperature steels and alloys using scanning electron microscopy

FR.1.27.2011.10218

Method for Determining the Size of Nanostructured Powders by Laser Diffraction

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